skip navigationU S P T O SealUnited States Patent and Trademark Office TTABVUE logo
Home|Site Index|Search|Guides|Contacts|eBusiness|eBiz alerts|News|Help
TTABVUE. Trademark Trial and Appeal Board Inquiry System
v2.5.0

Summary

Query: Party Name contains all words: NANOMETRICS INCORPORATED
Number of results: 7

Proceeding
Filing Date
Defendant(s),
Property(ies)
Plaintiff(s),
Property(ies)
91205544
06/11/2012
Nanometrics Incorporated
Mark: VERTEX S#:85244594
Xilinx, Inc.
Mark: VIRTEX S#:77312546 R#:3487690
Mark: VIRTEX S#:75700867 R#:2390496
Mark: VIRTEX II S#:76290005 R#:2658589
Mark: VIRTEX II PRO S#:76290007 R#:2578358
Mark: VIRTEX-4 S#:78340258 R#:3061015
Mark: VIRTEX 4 S#:78340244 R#:3159830
85244594
01/10/2012
Nanometrics Incorporated
Mark: VERTEX S#:85244594
Xilinx, Inc.
91202528
11/07/2011
Nanometrics Inc.
Mark: NANOMETRICS S#:77609519
Nanometrics Incorporated
Mark: NANOMETRICS S#:75145658 R#:2148695
85049541
06/23/2011
Carl Zeiss NTS GmbH
Mark: ATLAS S#:85049541
Nanometrics Incorporated
77609519
06/09/2011
Nanometrics Inc.
Mark: NANOMETRICS S#:77609519
Nanometrics Incorporated
76694146
03/01/2010
Nanometrics Incorporated
Mark: LYNX S#:76694146
76683287
03/09/2009
NANOMETRICS INCORPORATED
Mark: CALIPER INSIGHT S#:76683287
Veeco Instruments Inc.

Results as of 11/23/2024 06:09 PMSearch again
| .HOME | INDEX| SEARCH | eBUSINESS | CONTACT US | PRIVACY POLICY